Energy distribution of μd1s muonic atom and its spin states effecting on muonic X-Ray transfer yield in solid thin film method

Abstract

We have investigated the energy distribution of [Formula: see text] and its spin states (F) effecting on muonic X-ray transfer yield in the solid thin film method. Argon ( Ar ) ion has been considered as the implanted ion in solid deuterium (s D 2) layer at a temperature of T = 3 K. A kinetics model has been used, the corresponding rate equations have been constructed and our results of X-ray yield have been compared with recent measured data. The μd1s muonic atoms, which can take part in resonant molecular formation, have been separated from atoms participating in nonresonant reactions. On this basis, the integrated number of X-rays has been calculated. The results show that the effect of μd1s energy distribution on the number of X-photons is not serious, while its spin states strongly affect the muonic X-ray yield.