Cell-Based Smoothed Finite Element Method for the Intensity Factors of Piezoelectric Bimaterials with Interfacial Crack

Abstract

To improve the precision in resolving interfacial crack intensity factor of piezoelectric bimaterials in practical engineering, we proposed a cell-based smoothed finite element method (CS-FEM) that simulated the displacement field and electric field near the crack tips of piezoelectric bimaterials. The displacement field and electric field at the nodes behind crack tips were extracted and substituted into the extrapolation method of interfacial cracks of out-of-phase anisotropic piezoelectric bimaterials, aiming to solve the interfacial crack intensity factor of transversally isotropic piezoelectric bimaterials. With double-piezoelectric flat-plates containing center cracks as example, we investigated the intensity factors of different materials, loads, cell number and encryption modes. The results were compared with FEM and analytic solutions. Results of numerical cases showed that CS-FEM was computationally simple, precise and reliable and thus was attractive to engineers.