FLUCTUATIONS AND ULTRAFAST PROCESSES IN VOLTAGE-BIASED TWO-DIMENSIONAL CHANNELS
-
Published:2008-12
Issue:04
Volume:18
Page:923-933
-
ISSN:0129-1564
-
Container-title:International Journal of High Speed Electronics and Systems
-
language:en
-
Short-container-title:Int. J. Hi. Spe. Ele. Syst.
Affiliation:
1. Semiconductor Physics Institute, A. Goštauto 11, Vilnius 01108, Lithuania
Abstract
Hot-electron fluctuation techniques were developed for experimental investigation of picosecond and subpicosecond electronic and phononic processes in voltage-biased 2DEG channels of interest for microwave low-noise and high-power transistors. Examples illustrate real-space transfer, hot-electron energy relaxation, and occupancy relaxation of hot-phonon modes. The pioneering results on hot-electron energy relaxation and hot-phonon lifetime are confirmed by time-resolved response experiments. The fluctuation technique for measuring the hot-phonon lifetime as a function of the hot-phonon temperature is unique, no datum has been reported for comparison as yet.
Publisher
World Scientific Pub Co Pte Lt
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Electronic, Optical and Magnetic Materials
Reference31 articles.
1. Irreversibility and Generalized Noise
2. V. Bareikis, Spectroscopy of Nonequilibrium Electrons and Phonons, Modern Problems in Condensed Matter Sciences 35, eds. C. V. Shank and B. P. Zakharchenya (North-Holland, Amsterdam, 1992) p. 327396.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献