ELECTRONIC PROPERTIES OF THIN FILMS SUBLIMED FROMLa@C82ANDLi@C60-Reference-Cited by-同舟云学术

ELECTRONIC PROPERTIES OF THIN FILMS SUBLIMED FROMLa@C82ANDLi@C60

Published:2008-06 Issue:03 Volume:03 Page:155-160
ISSN:1793-2920
Container-title:Nano
language:en
Short-container-title:NANO

Author:

POPOK V. N.¹,GROMOV A. V.²,JÖNSSON M.³,TANINAKA A.⁴,SHINOHARA H.⁴,CAMPBELL E. E. B.¹²

Affiliation:

1. Department of Physics, University of Gothenburg, 41296 Göteborg, Sweden

2. School of Chemistry, Edinburgh University, West Mains Road, EH9 3JJ Edinburgh, Scotland

3. Institute of Physical Chemistry, Polish Academy of Sciences, ul. Kasprzaka 44/52, 01-224 Warsaw, Poland

4. Department of Chemistry, Nagoya University, 464-8602 Nagoya, Japan

Abstract

La @ C82and Li @ C60thin films obtained by sublimation in vacuum are studied using four-probe current–voltage measurements and atomic force microscopy. In situ electrical measurements show semiconducting behavior of both films with room-temperature resistivity of 21 ± 8 and 1230 ± 50 Ω · cm for the La @ C82and Li @ C60, respectively. A variable range hopping mechanism of conductance is suggested from the temperature dependences of resistance. The activation energies for electron transport are calculated for both metallofullerenes. Irreversible changes to the Li @ C60film structure increasing the film resistivity to values typical for C60are found at elevated temperatures. The effect of exposure to ambient atmosphere on the conductance of the films is discussed.

Publisher

World Scientific Pub Co Pte Ltd

Subject

Condensed Matter Physics,General Materials Science

Link

https://www.worldscientific.com/doi/pdf/10.1142/S1793292008000988

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