PCB Defect Detection Based on Improved Deep Learning Model

Abstract

Printed circuit boards (PCBs) play a critical role in electronic products. Ensuring these products’ long-term reliability and consistent performance requires effective PCB defect detection. Although existing deep learning models for PCB defect detection are not highly accurate, they often neglect capability considerations. This paper introduces a precise, fast, and lightweight defect detection model, CCG-YOLO, based on an enhanced YOLOv5 model to address this issue. The enhancements in CCG-YOLO can be summarized as follows: (1) Improved Backbone network: The feature extraction ability of the Backbone network is enhanced by introducing a C3HB module, which fosters spatial interaction capabilities. (2) Lightweight feature fusion network: A lightweight convolution structure called Ghost-Shuffle Convolution is incorporated in the feature fusion network, remarkably reducing model parameters while maintaining performance. (3) Efficient residual networking: To enhance model performance further, a CNeB module is introduced based on the ConvNeXt network, which replaces the C3 module in the Neck. CNeB improves model detection accuracy and reduces the number of model parameters. The combination of these enhancements results in impressive performance. CCG-YOLO achieves mean average precision (mAP@0.5) of 99.5% and 88.75% in mAP@0.5:0.95 on the TDD-Net public dataset. Compared with the original YOLOv5s algorithm, CCG-YOLO offers a 4.24% improvement in mAP@0.5:0.95, a 1[Formula: see text]MB reduction in model size, a 0.472[Formula: see text]M decrease in the number of parameters, a 0.6G floating point operation reduction in computational complexity, and a 120 frames per second real-time inference speed. These experimental results underscore that the proposed model excels in accuracy and speed and has a compact size for PCB defect detection. Moreover, CCG-YOLO is easily deployable on low-end devices, making it well-suited for meeting the real-time requirements of industrial defect detection.