NOISE MEASUREMENTS FOR MATERIAL DIELECTRIC CHARACTERIZATION: APPLICATION TO A LIQUID CRYSTAL-Reference-Cited by-同舟云学术

NOISE MEASUREMENTS FOR MATERIAL DIELECTRIC CHARACTERIZATION: APPLICATION TO A LIQUID CRYSTAL

Published:2001-09 Issue:03 Volume:01 Page:L125-L130
ISSN:0219-4775
Container-title:Fluctuation and Noise Letters
language:en
Short-container-title:Fluct. Noise Lett.

Author:

GÉRARD LEROY¹,JOËL GEST¹,PIERRE TABOURIER¹

Affiliation:

1. Laboratoire d'Etude des Matériaux et des Composants pour I'Electronique, UPRES - E.A. 2601, Université du Littoral Côte d'Opale, B.P. 717, 62 228 Calais, France

Abstract

In this paper, we show how noise measurements can be used for the characterization of a dielectric material. This nonperturbative technique allows the determination of the real and imaginary parts of the complex permittivity from current and voltage noise measurements. This technique is illustrated hereafter for the case of an antiferroelectric liquid crystal.

Publisher

World Scientific Pub Co Pte Lt

Subject

General Physics and Astronomy,General Mathematics

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0219477501000329

Reference8 articles.

1. Experimental Study of Nonlinear Dielectric Relaxation Spectra of Ferroelectric Liquid Crystals in the Smectic C*Phase

2. Electric field effects of dielectric and ferroelectric properties in chiral smectic liquid crystal dobambc

3. Polarization Noise in a Ferroelectric Liquid Crystal

4. 1/ƒ noise is no surface effect

5. Irreversibility and Generalized Noise

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