An Image Classification Method Based on Semi-Supervised Classification Learning and Convolutional Neural Networks

Author:

Shi Liyan1ORCID,Chen Hairui2

Affiliation:

1. The Open University of Henan, School of Information Engineering and Artificial Intelligence, Zhengzhou, Henan 450046, P. R. China

2. Zhongyuan University of Technology, Zhongyuan-Petersburg Aviation College, Zhengzhou, Henan 450000, P. R. China

Abstract

This paper aims to propose an improved image classification model to reduce the cost of model construction. Aiming at the problem that network training usually requires the support of a large number of labeled samples, an image classification model based on semi-supervised deep learning is proposed, which uses labeled samples to guide the network to learn unlabeled samples. A convolutional neural network model for simultaneous processing of labeled and unlabeled data is constructed. The tagged data is used to train the Softmax classifier and provide the initial K-means clustering center for the untagged data. The nonsubsampling contourlet layer is used to replace the first convolutional layer of the full convolutional neural network to extract multi-scale depth features, and the nonsubsampling contourlet full convolutional neural network is constructed. The network can extract multi-scale information of the images to be classified, and extract more discriminative deep image features. In addition, the parameters of the nonsubsampled contourlet layers are pre-set and do not require network training. The proposed method has higher classification accuracy than the contrast method on polarimetric SAR images using the nonsubsampled contourlet full convolutional neural network.

Publisher

World Scientific Pub Co Pte Ltd

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Electrical and Electronic Engineering,Hardware and Architecture

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Optimization of semi-supervised generative adversarial network models: a survey;International Journal of Intelligent Computing and Cybernetics;2024-07-31

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