Low-Power Anti-Glitch Double-Edge Triggered Flip-Flop Based on Robust C-Elements

Author:

Huang Zhengfeng1,Zhong Wanshu1,Duan Lanxi1,Zhang Yue2,Liang Huaguo1,Wang Jianan3,Song Tai4,Lu Yingchun1

Affiliation:

1. School of Microelectronics, Hefei University of Technology, 193 Tunxi Road, Hefei, Anhui 230009, P. R. China

2. School of Microelectronics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P. R. China

3. The 24th Research Institute of CETC, Chongqing 401332, P. R. China

4. School of Integrated Circuits, Anhui University, 11 Jiulong Road, Hefei, Anhui 230601, P. R. China

Abstract

Glitch at the input can increase the power consumption of flip-flop greatly. To solve this problem effectively, a Low-Power Anti-Glitch Double-Edge Triggered Flip-Flop Based on Robust C-Elements (LARC) is proposed in this paper. The proposed Latch Multiplexer-A Double-edge Triggered Flip-flop (LARC-DET) can effectively block the glitch at the input and prevent the redundant transition at internal nodes. As a result, the extra power consumption caused by the glitch at the input is effectively reduced. The simulation was performed using HSPICE under 32[Formula: see text]nm complementary metal oxide semiconductor (CMOS) process. The simulation results show that, compared with 12 double edge flip-flops, the proposed LARC-DET is the lowest in terms of power consumption and power delay product. Process voltage temperature (PVT) variation analysis shows its insensitivity to voltage variation, temperature variation and process variation.

Publisher

World Scientific Pub Co Pte Ltd

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Electrical and Electronic Engineering,Hardware and Architecture

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