Automation Software for Semiconductor Research Laboratories: Electrical Parameter Calculation Program (SeCLaS-PC)

Abstract

We prepared a simple program for basic electrical measurements and parameter extraction from these measurements of metal–semiconductor (MS) contacts. In this paper, we introduce a basic electrical parameter calculation software (SeCLaS-PC) for semiconductor laboratories from the temperature-dependent/independent current–voltage ([Formula: see text]–[Formula: see text]), capacitance– voltage ([Formula: see text]–[Formula: see text]) and capacitance–frequency ([Formula: see text]–[Formula: see text]) measurement results. SeCLaS-PC program was developed using Keysight VEE Pro (Visual Engineering Environment) software and the program has a user-friendly graphical interface. More than 50 device parameters can be easily obtained, using different methods, from the [Formula: see text]–[Formula: see text], temperature-dependent [Formula: see text]–[Formula: see text] and temperature-dependent [Formula: see text]–[Formula: see text] measurement results for one device, with our SeCLaS-PC program.