Guided Intelligent Hyper-Heuristic Algorithm for Critical Software Application Testing Satisfying Multiple Coverage Criteria

Author:

Rani S. Alagu1,Akila C.1,Raja S. P.2

Affiliation:

1. Department of Computer Science and Engineering, Anna University Regional Campus, Tirunelveli 627007, Tamil Nadu, India

2. School of Computer Science and Engineering, Vellore Institute of Technology, Vellore - 632 014, Tamil Nadu, India

Abstract

This paper proposes a novel algorithm that combines symbolic execution and data flow testing to generate test cases satisfying multiple coverage criteria of critical software applications. The coverage criteria considered are data flow coverage as the primary criterion, software safety requirements, and equivalence partitioning as sub-criteria. The characteristics of the subjects used for the study include high-precision floating-point computation and iterative programs. The work proposes an algorithm that aids the tester in automated test data generation, satisfying multiple coverage criteria for critical software. The algorithm adapts itself and selects different heuristics based on program characteristics. The algorithm has an intelligent agent as its decision support system to accomplish this adaptability. Intelligent agent uses the knowledge base to select different low-level heuristics based on the current state of the problem instance during each generation of genetic algorithm execution. The knowledge base mimics the expert’s decision in choosing the appropriate heuristics. The algorithm outperforms by accomplishing 100% data flow coverage for all subjects. In contrast, the simple genetic algorithm, random testing and a hyper-heuristic algorithm could accomplish a maximum of 83%, 67% and 76.7%, respectively, for the subject program with high complexity. The proposed algorithm covers other criteria, namely equivalence partition coverage and software safety requirements, with fewer iterations. The results reveal that test cases generated by the proposed algorithm are also effective in fault detection, with 87.2% of mutants killed when compared to a maximum of 76.4% of mutants killed for the complex subject with test cases of other methods.

Publisher

World Scientific Pub Co Pte Ltd

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Electrical and Electronic Engineering,Hardware and Architecture

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