Long-Range Dependencies and Statistical Self-Similarity in Computer Memory System
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Published:2015-02-10
Issue:03
Volume:24
Page:1550031
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ISSN:0218-1266
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Container-title:Journal of Circuits, Systems and Computers
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language:en
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Short-container-title:J CIRCUIT SYST COMP
Affiliation:
1. Rzeszów University of Technology, Department of Distributed Systems, al.Powstańców Warszawy 12, 35-959 Rzeszów, Poland
Abstract
This paper shows the problem of possible existence of statistical self-similarity and long-range (long-term) dependencies in behavior of computer memory systems. It will be shown, that the hierarchical structure of memory and the dispersion of time constants during accessing successive levels of such a structure, lead to "memory effect" and self-similarity. These effects have not been taken into account so far in computer systems design, management and description. A few methods were used to calculate the Hurst H coefficient, which reflects the statistical self-similarity in time series and the d parameter that represents the problem of long-range dependencies.
Publisher
World Scientific Pub Co Pte Lt
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Electrical and Electronic Engineering,Hardware and Architecture