Investigating the Impact of Test Case Density and Execution Variety on Fault Localization for Novice Programs

Author:

Wang YingChun1,He Lin1,Chen Nannan2,Zhai Qi3ORCID

Affiliation:

1. Institue of Noise and Vibration, Naval University of Engineering, Wuhan, P. R. China

2. National Key Laboratory on Ship Vibration and Noise, Wuhan, P. R. China

3. The Eighth Military Representatives Office of the Naval Equipment Department, Shanghai, P. R. China

Abstract

Programming Online Verification Exam (OE) system has been widely used in algorithm education and practice since it can automatically analyze program results (e.g., correct or incorrect) after executing the submitted programs with corresponding test cases. OE systems can provide both execution results and error information so that novice programmers can get feedback quickly. If the submitted program cannot pass all the test cases, the novice programmers will get wrong-answer feedback, and they have to find and fix the errors in the program. Automated program fault localization techniques, which can locate the errors in programs under test automatically, thus help novice programmers fix the errors quickly. However, the performance of current automated fault localization techniques is limited due to the high-density test cases in novice programs of OE system. In this paper, we analyze the impact of test case density (TCD) and execution variety on fault localization performance and propose a method to reduce TCD to improve fault localization precision for novice programs. To evaluate the performance of our method, we conduct a number of empirical studies on 1199 real fault diagnosis algorithm related novice programs, and the experimental results show that using improved test cases through our method for fault localization in OE system can enhance the precision of fault localization for novice programs. Specifically, after decreasing the test cases’ density, the improvement of fault localization accuracy ranges from 0.6% to 17.34% in terms of the Expense metric, and from the Accuracy@N metrics, the number of faulty statements that can be found increases in most cases.

Publisher

World Scientific Pub Co Pte Ltd

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Media Technology

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3