Structured illumination microscopy based on asymmetric three-beam interference

Author:

Xu Linyu1ORCID,Zhang Yanwei2,Lang Song2,Wang Hongwei2,Hu Huijie2,Wang Jingkai2,Gong Yan12

Affiliation:

1. University of Science and Technology of China, Hefei, Anhui 230026, P. R. China

2. Suzhou Institute of Biomedical Engineering and Technology, Chinese Academy of Sciences, Suzhou, Jiangsu 215163, P. R. China

Abstract

Structured illumination microscopy (SIM) is a rapidly developing super-resolution technology. It has been widely used in various application fields of biomedicine due to its excellent two- and three-dimensional imaging capabilities. Furthermore, faster three-dimensional imaging methods are required to help enable more research-oriented living cell imaging. In this paper, a fast and sensitive three-dimensional structured illumination microscopy based on asymmetric three-beam interference is proposed. An innovative time-series acquisition method is employed to halve the time required to obtain each raw image. A segmented half-wave plate as a substantial linear polarization modulation method is applied to the three-dimensional SIM system for the first time. Although it needs to acquire 21 raw images instead of 15 to reconstruct one super-resolution image, the SIM setup proposed in this paper is 30% faster than the traditional spatial light modulator-SIM (SLM-SIM) in imaging each super-resolution image. The related theoretical derivation, hardware system, and verification experiment are elaborated in this paper. The stable and fast 3D super-resolution imaging method proposed in this paper is of great significance to the research of organelle interaction, intercellular communication, and other biomedical fields.

Funder

Scientific Research and Equipment Development Project of CAS

The National Key R&D Program of China

Major Innovative Research Team of Suzhou

Publisher

World Scientific Pub Co Pte Lt

Subject

Biomedical Engineering,Atomic and Molecular Physics, and Optics,Medicine (miscellaneous),Electronic, Optical and Magnetic Materials

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