Affiliation:
1. School of Computer Science and Technology, Harbin University of Science and Technology, Harbin 150000, P. R. China
2. School of Automation, Harbin University of Science and Technology, Harbin 150000, P. R. China
3. Postdoctoral Workstation of Jiamusi Enterprise Group, Jiamusi 154000, P. R. China
Abstract
To address the problems of insufficient accuracy and slow reconstruction speed of Planar Electrical Capacitance Tomography (PECT) detection of damaged specimens, a Dual Generative Adversarial Networks (DualGAN)-based PECT image defect detection method is proposed in this paper. The improved particle swarm algorithm with adaptive particle number and L2-norm is used to optimize the sensitivity field, combined with the parallel Landweber algorithm to solve the PECT inverse problem to obtain the dielectric constant distribution map. In the DualGAN network, the Unet generator utilizes an Adam-based local attention mechanism to adjust module weights, facilitating feature extraction and the generation of high-quality transformation images of the Landweber dielectric constant distribution. A PatchGAN discriminator is employed to distinguish between transformation images and real images, using the generated transformation images as target images. Experimental results demonstrate that the sensitivity field, enhanced by the improved particle swarm algorithm and L2-norm normalization, achieves better balance. Furthermore, the addition of a network transformation using the Adam-based local attention weight mechanism on the DualGAN network reduces artifacts in the reconstructed images, resulting in more accurate PECT reconstructions. The PECT image defect detection method, integrating DualGAN, an improved particle swarm optimization algorithm, and a local attention mechanism, has made significant strides in addressing challenges related to image reconstruction accuracy and speed. This technological advancement has enhanced the precision and efficiency of defect detection in carbon fiber composite materials, thereby fostering the broader utilization of planar capacitance tomography technology in industrial damage detection and material defect analysis.
Publisher
World Scientific Pub Co Pte Ltd