SILICON (Si)-Reference-Cited by-同舟云学术

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SILICON (Si)

Published:1996-07-02 Issue: Volume: Page:1-32
ISSN:
Container-title:Handbook Series on Semiconductor Parameters
language:
Short-container-title:

Author:

Levinshtein M. E.¹,Rumyantsev S. L.¹

Affiliation:

1. Ioffe Institute, St. Petersburg, Russia

Publisher

WORLD SCIENTIFIC

Cited by 68 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Enhancing the performance of an InAsSb/InAlSb-based pBn photodetector for early detection of a biomarker of bone marrow cancer: a proposed and simulated approach with extended-midwave response and step-graded barrier design;Sensing and Imaging;2024-04-22

2. All-optical generation of static electric field in a single metal-semiconductor nanoantenna;Light: Science & Applications;2023-09-19

3. X-Ray Diffraction and Raman Spectroscopy Analyses of GaSb-Enriched Si Surface Formed by Applying Diffusion Doping Technique;East European Journal of Physics;2023-09-04

4. Composition-Defined Optical Properties and the Direct-to-Indirect Transition in Core–Shell In_1–xGa_xP/ZnS Colloidal Quantum Dots;Journal of the American Chemical Society;2023-07-19

5. Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives;Beilstein Journal of Nanotechnology;2023-06-14

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