POSITRON MICROSCOPES AND MICROPROBES-Reference-Cited by-同舟云学术

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POSITRON MICROSCOPES AND MICROPROBES

Published:2000-01 Issue: Volume: Page:227-236
ISSN:
Container-title:Positron Beams and Their Applications
language:
Short-container-title:

Author:

COLEMAN P.G.¹

Affiliation:

1. Department of Physics, University of Bath, Claverton Down, Bath BA2 7AY, UK

Publisher

WORLD SCIENTIFIC

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Positron Annihilation Studies of Materials;Characterization of Materials;2012-10-12

2. Origin of defect-insensitive emission probability in In-containing (Al,In,Ga)N alloy semiconductors;Nature Materials;2006-09-03

3. Positron Annihilation Studies of Materials;Characterization of Materials;2003-11-15

4. Defects in CeO[sub 2]/SrTiO[sub 3] fabricated by automatic feeding epitaxy probed using positron annihilation;Journal of Applied Physics;2003

5. Submillimeter focusing of the University of Hong Kong positron beam;Applied Surface Science;2002-06

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