Investigation on multilayer microstructure grating for three-port splitting

Author:

Shu Wenhao1,Wang Bo1,Pei Hao1,Li Hongtao1,Chen Li1,Lei Liang1,Zhou Jinyun1

Affiliation:

1. School of Physics and Optoelectronic Engineering, Guangdong University of Technology, Guangzhou 510006, China

Abstract

A new structure of microstructure reflection three-port beam splitter grating is described in this paper. The grating includes two dielectric layers and a metal slab on the substrate, where incident waves are reflected into the zeroth-order and the ± first-order with polarization-independent property. With the optimized grating profile, reflection efficiencies’ ratios between the first-order and the zeroth-order can reach 0.998 and 1.001 for TE and TM polarizations, respectively. Especially, the reflection grating can diffract efficiencies more than 30% into the ± first-order and the zeroth-order with the incident angular bandwidth of −1.9–1.9[Formula: see text] for TM polarization, which can have merits compared with single-layer transmission grating.

Funder

National Natural Science Foundation of China

Publisher

World Scientific Pub Co Pte Lt

Subject

Condensed Matter Physics,Statistical and Nonlinear Physics

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