Comparative study of liquid crystal variable retarder with rubbed polyimide and SiO2 thin films by glancing angle deposition

Author:

Ou Shaozhong12ORCID,Wang Jianguo234ORCID,Zhao Yuan’an23,Liu Xiaofeng23,Mo Zhichang234,Wang Kun12,Tao Chunxian1

Affiliation:

1. Engineering Research Center of Optical Instruments and Systems, Ministry of Education, University of Shanghai for Science and Technology, Shanghai 200093, China

2. Laboratory of Thin Film Optics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

3. Key Laboratory of Materials for High Power Laser, Chinese Academy of Sciences, Shanghai 201800, China

4. Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China

Abstract

A comparative study on the optical, morphological and laser-induced damage characteristics of rubbed polyimide, SiO2 thin films by glancing angle deposition, and the corresponding liquid crystal (LC) retarders, is presented in this paper. SiO2 inorganic thin films were prepared with a deposition angle of 45[Formula: see text], and traditional polyimide (PI) films were prepared by spin coating and rubbing. The experimental results indicate that the SiO2 thin films have a good transmittance and resistance to laser damage. The transmittance of the SiO2 thin films was above 92% in the wavelength range 400–1200 nm, and that of the corresponding LC retarder was approximately 90% in the wavelength range 800–1200 nm. The laser-induced damage threshold of the SiO2 thin films reached 32.6 J/cm2, and that of the corresponding LC retarder was 1.84 J/cm2. These results are better than those of the PI alignment films. SiO2 thin films have potential for use in the LC optical devices for laser applications.

Funder

National Natural Science Foundation of China

Publisher

World Scientific Pub Co Pte Ltd

Subject

Condensed Matter Physics,Statistical and Nonlinear Physics

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