Study of Mn–Co–Ni–O thin films incorporated with Cu and Cu/Sc elements and properties of the detectors

Abstract

Thin films [Formula: see text] (MCNO), [Formula: see text] (MCNCuO) and [Formula: see text] (MCNCuScO) are prepared by Chemical Solution Deposition method. The results show that the addition of Cu and Cu/Sc elements can reduce the grain boundary energy and the grain boundary angle to improve the single crystal degree of MCNO thin film. Through the analysis of MCNCuScO thin film, it is found that the stability of spinel structure mainly depends on the octahedron rather than tetrahedron. The bandgap of the samples from small to large is separately MCNCuScO, MCNCuO and MCNO films. The absorptivity within the waveband of [Formula: see text] plays a decisive role in the performance of the detector. At the same frequency, the MCNCuO thin film detector has the highest voltage responsivity, followed by the MCNCuScO thin film detector, while the MCNO film detector has the lowest responsivity.