CHARACTERIZATION OF SUPERCONDUCTING MULTILAYERED FILMS USING RBS AND TEM-Reference-Cited by-同舟云学术

CHARACTERIZATION OF SUPERCONDUCTING MULTILAYERED FILMS USING RBS AND TEM

Published:2001-12-20 Issue:28n29 Volume:15 Page:1314-1320
ISSN:0217-9849
Container-title:Modern Physics Letters B
language:en
Short-container-title:Mod. Phys. Lett. B

Author:

ENGEL ANDREAS¹,JOE TRODAHL H.¹,MARKWITZ ANDREAS²,JOHN KENNEDY V.²

Affiliation:

1. School of Chemical and Physical Sciences, Victoria University of Wellington, Kelburn Parade, Wellington, New Zealand

2. Institute of Geological and Nuclear Sciences, 30 Gracefield Road, Lower Hutt, New Zealand

Abstract

Amorphous multilayered films of superconducting Ta x Ge 1-x -alloy and insulating Ge have been characterized using RBS and TEM. The films were prepared using physical vapor evaporation and the substrates were tilted with respect to the incoming vapor flux, in order to achieve a columnar microstructure exhibiting strong flux-pinning in the superconducting mixed phase. RBS and TEM were successfully applied to obtain detailed information on the layering, columnar microstructure and chemical composition of the superconducting films.

Publisher

World Scientific Pub Co Pte Lt

Subject

Condensed Matter Physics,Statistical and Nonlinear Physics

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0217984901003214

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