Affiliation:
1. Department of Physics, State University of New York at Buffalo, Amherst, NY 14260, USA
Abstract
This paper presents a brief review of nondestructive methods useful for the general purpose of characterizing nanostructure in layered materials using x-rays from synchrotron radiation. By way of examples, some practical applications of these methods to the study of layered systems of recent technological interest are demonstrated.
Publisher
World Scientific Pub Co Pte Lt
Subject
Electrical and Electronic Engineering,Computer Science Applications,Condensed Matter Physics,General Materials Science,Bioengineering,Biotechnology