RESONANT RAYLEIGH SCATTERING OF LIGHT BY SEMICONDUCTOR MICROCAVITY

Abstract

Experimental study of Resonant Rayleigh Scattering (RRS) of light by a semiconductor microcavity was carried out on a double cavity sample. The shifts of RRS lines spectral positions with sample rotation demonstrate clearly polariton dispersion. The shape of the lines depends strongly on the position of the excitation spot on the structure surface and temperature. The treatment of experimental data in terms of the Fano quantum mechanical interference between a discreet state and continuum gives a direct method to study polariton scattering probabilities.