FREQUENCY-DEPENDENT POLARIZABILITY OF SMALL SILICON CLUSTERS

Author:

MAKWANI DIKSHA1,VIJAYA R.1

Affiliation:

1. Department of Physics, Indian Institute of Technology Bombay, Mumbai, Maharashtra 400 076, India

Abstract

Polarizability of small Si n (n = 3 to 9) clusters has been calculated using density functional theory (DFT) with Vosko–Wilk–Nusair (VWN) correlation functional. The computed values of polarizability per atom tend to decrease with increasing cluster size. Frequency-dependent polarizability of Si 3, Si 4, Si 6, and Si 9 clusters demonstrates that the polarizability increases slowly with the increase in the energy for energy values less than 1.2 eV but exhibit the same size-dependent features as the static polarizability. The first resonance energy for Si 3, Si 4, Si 6, and Si 9 clusters occur at 1.25, 1.63, 2.5, and 1.98 eV, respectively. Moreover, the anisotropic polarizability is found to be the highest for Si 9 cluster.

Publisher

World Scientific Pub Co Pte Lt

Subject

Electrical and Electronic Engineering,Computer Science Applications,Condensed Matter Physics,General Materials Science,Bioengineering,Biotechnology

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