IMPEDANCE ANALYSIS FOR CHARACTERIZATION OF MATERIALS USED IN ORGANIC TRANSISTORS

Abstract

A method of impedance frequency response analysis (FRA) with template multilayer organic capacitor was studied to evaluate printable materials for all-printed organic field-effect transistors (OFETs). The new method allows us not only to characterize simultaneously dielectric and conductive behaviors of the materials but also to distinguish contributions to electrical conduction or to polarization from different sources such as dielectric layer, semiconductor layer, and different interfaces for OFETs. As a dielectric layer for OFETs, Urathan is preferred because of lower conductivity, nonmetallic conduction behavior at high temperature, and lower interfacial resistance. Conductivity and dielectric enhancement of Urathan can be realized by heating. The critical temperature for conductivity and dielectricity transition was calculated from FRA from temperature dependent experiments. The method could be a standard for fast screening and assessing printable materials for OFETs.