Affiliation:
1. Department of Physics, Indian Institute of Technology Guwahati Guwahati-781039, India
Abstract
Growth of Ag nanostructures on Si (111)-7 × 7 surfaces has been investigated at the atomic scale regime by studying the evolution of nanoscale surface morphology with Ag coverage. Ag growth on Si (111)-7 × 7 surfaces at room temperature showed a strongly preferential height with even atomic layer thick flat top percolated islands. Here we report that the roughness scaling exponent α and growth scaling exponents β associated with such electronic growth mode are determined by statistical analysis of rough surfaces obtained from scanning tunneling micrograph images of Ag nanostructures grown on Si (111)-7 × 7 surfaces. Observed roughness and growth exponent for this system are 0.82±0.02 and 0.45±0.04, respectively.
Publisher
World Scientific Pub Co Pte Lt
Subject
Electrical and Electronic Engineering,Computer Science Applications,Condensed Matter Physics,General Materials Science,Bioengineering,Biotechnology