Dark field Z-scan microscopic configuration for nonlinear optical measurements: Numerical study

Abstract

This study deals with numerical simulations to optimize the parameters of the Dark Filed Z-scan (DFZ-scan) in a microscopic configuration for third-order nonlinear (NL) refraction measurements into thin films. The method allows dynamic, transparent, nonlinear phase shifts to be clearly visible. The simulations of such images are obtained for very low-induced refractive indices. Darkfield illumination requires blocking out of the central light which ordinarily passes through and around (surrounding) the NL specimen. A table to approximate circular aperture stop size versus magnification will be given depending on the focusing lens into the tested material.