SELECTING THE MOST RELIABLE POPULATION UNDER STEP-STRESS ACCELERATED LIFE TEST-Reference-Cited by-同舟云学术

SELECTING THE MOST RELIABLE POPULATION UNDER STEP-STRESS ACCELERATED LIFE TEST

Published:1999-12 Issue:04 Volume:06 Page:347-359
ISSN:0218-5393
Container-title:International Journal of Reliability, Quality and Safety Engineering
language:en
Short-container-title:Int. J. Rel. Qual. Saf. Eng.

Author:

CHING TANG LOON¹,SUN YESHENG²

Affiliation:

1. Department of Industrial and Systems Engineering, National University of Singapore, Kent Ridge, Singapore 119260, Singapore

2. Chartered Semiconductor Manufacturing Ltd, Woodlands Industrial Park D, St. 2, Singapore 738406, Singapore

Abstract

We present a method for selecting the most reliable population under step-stress accelerated life testing with type II censoring. We construct a new statistic, the transitional order statistic (TOS), and derive an approximate expression for its distribution. Using the TOS, a selection rule is formulated from the test results. For planning purposes, we establish the relation between sample size and the probability of correct selection by defining a nonlinear indifference zone under the least favorable configuration. Finally, a simulation study is performed to illustrate the selection procedure and to validate the associated probability of correct selection.

Publisher

World Scientific Pub Co Pte Lt

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Energy Engineering and Power Technology,Aerospace Engineering,Safety, Risk, Reliability and Quality,Nuclear Energy and Engineering,General Computer Science

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0218539399000322

Reference8 articles.

1. Selecting the most reliable design under type-II censored accelerated testing

2. A class of subset selection procedures for Weibull populations

3. Sample Size for Selecting the Better of Two Weibull Populations

4. Nonparametric Procedures for Selecting the $t$ Population with the Largest $\alpha$-Quantiles

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1. Multiple-steps Step-stress Accelerated Life Test;Handbook of Reliability Engineering