GENERALIZED CSP-(C1, C2) SAMPLING PLAN FOR CONTINUOUS PRODUCTION PROCESSES

Author:

BALAMURALI S.1,KALYANASUNDARAM M.2,JUN CHI-HYUCK1

Affiliation:

1. Division of Mechanical and Industrial Engineering, Pohang University of Science and Technology, Pohang 790-784, South Korea

2. Manufacturing Applications and Systems (MAS), ST Microelectronics, AMK Wafer Fab-6, Level-2, #18, Ang Mo Kio Industrial, Park-2, Singapore 569505, Singapore

Abstract

In this paper, a new continuous sampling plan is introduced whose sampling inspection phase is characterized by the maximum allowable number of nonconforming units c1 and c2 and the sampling rates f1 and f2 and is designated as CSP-(C1, C2). A Markov chain model for the proposed plan is formulated and certain common measures of performance are derived. The continuous sampling plan of type CSP-C developed by Govindaraju and Kandasamy12 is a special case of this new sampling plan. Moreover, Dodge's continuous sampling plan (CSP-1) also becomes a special case of proposed plan. The advantage of the proposed plan is to achieve a reduction in the average fraction inspected at good quality levels compared with the CSP-1 and other continuous sampling plans.

Publisher

World Scientific Pub Co Pte Lt

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Energy Engineering and Power Technology,Aerospace Engineering,Safety, Risk, Reliability and Quality,Nuclear Energy and Engineering,General Computer Science

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