Next-Generation Information Technology Systems for Fast Detectors in Electron Microscopy-Reference-Cited by-同舟云学术

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Next-Generation Information Technology Systems for Fast Detectors in Electron Microscopy

Published:2020-03-19 Issue: Volume: Page:83-120
ISSN:
Container-title:Handbook on Big Data and Machine Learning in the Physical Sciences
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Author:

Weber Dieter¹²,Clausen Alexander¹,Dunin-Borkowski Rafal E.¹

Affiliation:

1. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, Jülich, Germany

2. Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany

Publisher

World Scientific

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Notes and References;Principles of Electron Optics, Volume 3;2022

2. Live Processing of Momentum-Resolved STEM Data for First Moment Imaging and Ptychography;Microscopy and Microanalysis;2021-08-05

3. Characterization of the terrace-defect interfaces using in situ straining techniques;Journal of Materials Research;2021-02-18

4. Advances in the electron diffraction characterization of atomic clusters and nanoparticles;Nanoscale Advances;2021

5. LiberTEM: Software platform for scalable multidimensional data processing in transmission electron microscopy;Journal of Open Source Software;2020-06-20

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