THE EXACT RUN LENGTH DISTRIBUTION AND DESIGN OF THE S2 CHART WHEN THE IN-CONTROL VARIANCE IS ESTIMATED

Author:

CASTAGLIOLA PHILIPPE1,CELANO GIOVANNI2,CHEN GEMAI3

Affiliation:

1. Université de Nantes & IRCCyN UMR CNRS 6597, 44475 Carquefou, France

2. Università di Catania, Catania, Italy

3. University of Calgary, Calgary, Alberta, T2N 1N4, Canada

Abstract

When monitoring the process variability, it is a common practice that a Phase I data set is used to estimate the unknown in-control process standard deviation σ0 or variance [Formula: see text] to set up the control limits, then monitoring proceeds. Once the process is considered to be in-control, the estimated control limits are assumed as fixed. This practice ignores the effect of estimating the unknown in-control process variance [Formula: see text]. In this paper, we derive the exact run length distribution of the S2 control chart when the in-control process variance [Formula: see text] is estimated and find that m = 200 or more Phase I samples are needed to neglect the effect of using estimated control limits. New control limits when m is small are also derived.

Publisher

World Scientific Pub Co Pte Lt

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Energy Engineering and Power Technology,Aerospace Engineering,Safety, Risk, Reliability and Quality,Nuclear Energy and Engineering,General Computer Science

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