EARLY QUALITATIVE SOFTWARE RELIABILITY PREDICTION AND RISK MANAGEMENT IN PROCESS CENTRIC DEVELOPMENT THROUGH A SOFT COMPUTING TECHNIQUE

Author:

MOHAN K. KRISHNA1,VERMA A. K.2,SRIVIDYA A.3

Affiliation:

1. Reliability Engineering, Indian Institute of Technology, Bombay, Mumbai-400076, India

2. Department of Electrical Engineering, Indian Institute of Technology, Bombay, Mumbai-400076, India

3. Department of Civil Engineering, Indian Institute of Technology, Bombay, Mumbai-400076, India

Abstract

A unique take on strengthening the role of a prototype of a software system without actually realizing it, would be to arrive at predictions using historical information from similar PoCs or the permeating experience of those involved in projects of comparable nature. Abundance of soft computing techniques should make this crucial bypassing feasible. The purpose of the this work is to demonstrate the same. Validation of this approach could be obtained by comparing the results with the ones obtained on realized prototypes at module level. In a work of the first of its kind involving studies at the PoC level, qualititave predictions for the metric 'number of defects' are obtained using a generic Fuzzy Logic based modeling. A sound mathematical base for the calculation of slopes of various Fuzzy membership functions employed is explained in detail for the case studies considered. This framework is applicable to any of the process oriented developmental systems like rational unified process. Pivotal risk management schemes are put forward. Significance of orthogonal defect classification method is explained in the context of the case study considered earlier.

Publisher

World Scientific Pub Co Pte Lt

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Energy Engineering and Power Technology,Aerospace Engineering,Safety, Risk, Reliability and Quality,Nuclear Energy and Engineering,General Computer Science

Reference8 articles.

1. R. C. Berkan and S. L. Trubatch, Building Fuzzy IF-THEN Rules Bases (IEEE PRESS, 1977) p. 70.

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