Affiliation:
1. Statistics Group TSA-1, Los Alamos National Laboratory, P. O. Box 1663 (MS F600), Los Alamos, NM 87545, USA
Abstract
Bayesian reliability demonstration test plans are developed for binomial and exponential sampling distributions using mixtures of beta and inverse gamma prior distributions, respectively. Both types of plans consider a single specified target reliability and rectify an important drawback of an existing well-known classical single-level test planning procedure. The plans are developed in such a way that they attain a specified probability of passing the test when the target reliability has been met as well as provide desired confidence that the target reliability has been met given that the test has been passed.
Publisher
World Scientific Pub Co Pte Lt
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Energy Engineering and Power Technology,Aerospace Engineering,Safety, Risk, Reliability and Quality,Nuclear Energy and Engineering,General Computer Science
Cited by
4 articles.
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