METRICS FOR MEASURING THE EFFECT OF MENTAL STRESS ON FAULT GENERATION DURING SOFTWARE DEVELOPMENT
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Published:1994-06
Issue:02
Volume:01
Page:257-275
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ISSN:0218-5393
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Container-title:International Journal of Reliability, Quality and Safety Engineering
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language:en
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Short-container-title:Int. J. Rel. Qual. Saf. Eng.
Author:
FURUYAMA TSUNEO1,
ARAI YOSHIO1,
IIO KAZUHIKO1
Affiliation:
1. NTT Software Laboratories 9–11, Midori-cho 3-chome, Musashino-shi, Tokyo 180, Japan
Abstract
The effects of mental stress on fault-generation are quantitatively determined through a controlled experiment. Two teams develop the same software program under the same conditions, except for mental stress. One team is mentally stressed during the functional design phase, while the other one is not. The degree of stress is measured by two types of metrics: “inner metrics” and “outer metrics”. The inner metrics, which measure the degree of stress, show that the “stressed team” generates more faults than the “nonstressed team”. Among the inner metrics, the “schedule pressure” and “workload” metrics are the most effective for predicting fault generation. Among the outer metrics, the fatigue meter value is related to all inner metrics and is therefore useful for verifying the inner metric values.
Publisher
World Scientific Pub Co Pte Lt
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Energy Engineering and Power Technology,Aerospace Engineering,Safety, Risk, Reliability and Quality,Nuclear Energy and Engineering,General Computer Science
Cited by
1 articles.
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