TOXIC CHROMIUM ANALYSED BY PIXE

Author:

FOLKMANN FINN1

Affiliation:

1. Institute of Physics and Astronomy, Aarhus University DK-8000 Aarhus C, Denmark

Abstract

Exciting different Cr-containing chemical compounds with heavy ions, e.g. 1.4 MeV/u 12C16O and 35Cl K x rays from Cr were measured with high resolution by diffraction in a curved crystal and with a position sensitive detector. Small differences are seen for different compounds and valancy states 3 and 6 of Cr (6 is toxic).

Publisher

World Scientific Pub Co Pte Lt

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. QUANTITATIVE ANALYSIS FOR Cr(III) AND Cr(VI) IONS IN ENVIRONMENTAL WATER SAMPLES BY USING PIXE;International Journal of PIXE;2005-01

2. High-resolution PIXE instrumentation survey. Part II;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-04

3. Analysis by absorption and scattering of radiation;Journal of Radioanalytical and Nuclear Chemistry;1997-07

4. Chemical effects in Cr containing samples measured by the KβKα intensity ratio and the Kβ energy shift;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04

5. High resolution ion induced X-ray spectroscopy for chemical state analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-04

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