APPLICATIONS OF X-RAY EMISSION TO ELEMENTAL ANALYSIS OF FOODS

Abstract

Trace element analysis via X-Ray Fluorescence (XRF) and Proton-Induced X-Ray Emission (PIXE) techniques were applied to several samples of fresh and processed foods. Thin samples of fresh fruits and vegetables, processed dry foods. and spices were included in these analyses. The results indicate that XRF and/or PIXE analysis is applicable to these types of samples but require special and simple modifications in sample preparation techniques, and the inclusion of new matrix type corrections for data analysis. However, the non-destructive nature, reproducibility, efficiency and high sensitivity that characterize these multi-element analytical procedures can provide new potential methods for detecting trace elements in foods and in many agricultural commodities. Toxic metals such as Hg, Pb. and As were detected in some foods. In addition, other essential or neutral trace elements such as Na, K, Mg, Ca, Cu, Cr, V, Zn, Mo, Fe, Mn, Ni, Se, Cl, S, and P were also detected. These and other elements can be analyzed rapidly and with high sensitivity for applications in process control and for certification of food quality. Developing these techniques and procedures specifically for food and for various agricultural products may provide new analytical options and help mitigate the expected impact of forthcoming regulations intended to establish limits and tolerance levels for micro toxicants and other essential nutrients in foods and agricultural products.