BEAM DAMAGE OF CELLULAR SAMPLES IN IN-AIR MICRO PIXE ANALYSIS-Reference-Cited by-同舟云学术

BEAM DAMAGE OF CELLULAR SAMPLES IN IN-AIR MICRO PIXE ANALYSIS

Published:2004-01 Issue:03n04 Volume:14 Page:75-81
ISSN:0129-0835
Container-title:International Journal of PIXE
language:en
Short-container-title:Int. J. PIXE

Author:

KOMORI H.¹,MIZUMA K.¹,ISHII K.¹,YAMAZAKI H.¹,MATSUYAMA S.¹,AMARTAIVAN TS.¹,OHISHI Y.¹,RODRIGUEZ M.¹,YAMAGUCHI T.¹,SUZUKI A.¹,SATOH M.²,KAMIYA T.³,SAKAI T.³,SATOH T.³,OIKAWA M.³,ARAKAWA K.³

Affiliation:

1. Department of Quantum Science and Energy Engineering, Tohoku University, Aramaki-Aza-Aoba 01, Aoba-ku, Sendai 980-8579, Japan

2. Department of Mechatronics and Precision Engineering, Tohoku University, Aramaki-Aza-Aoba 01, Aoba-ku, Sendai 980-8579, Japan

3. Takasaki Radiation Chemistry Research Establishment, Japan Atomic Energy Research Institute, Takasaki, Gunma 370-1292, Japan

Abstract

The change of shape and elemental concentration of cellular samples in In-Air micro PIXE analysis was investigated. Cultured bovine aortic endothelial cells were analyzed in the atmosphere by using 2.6 MeV proton micro-beams. The shape of cross-sections of cells was not so much distorted by beam irradiation and the concentrations of trace elements did not change too, except for S. The concentration of S changed with strongly depending on the temperature rise due to beam irradiation.

Publisher

World Scientific Pub Co Pte Lt

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0129083504000124

Reference9 articles.

1. Mass loss during X-ray microanalysis

2. Nuclear microscopy of single whole cultured cells: Beam damage studies

3. Elemental analysis of cellular samples by in-air micro-PIXE

4. APPLICATION OF MICRO-PIXE CAMERA TO ELEMENTAL ANALYSIS OF A SINGLE CELL

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3. Progress and application of the Tohoku microbeam system;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-07

4. DEVELOPMENT OF AN IN-AIR ON/OFF AXIS STIM SYSTEM FOR QUANTITATIVE ELEMENTAL MAPPING;International Journal of PIXE;2006-01