A REVIEW OF PARTICLE-INDUCED X-RAY EMISSION IN GEOLOGY-Reference-Cited by-同舟云学术

A REVIEW OF PARTICLE-INDUCED X-RAY EMISSION IN GEOLOGY

Published:1991-01 Issue:04 Volume:01 Page:311-338
ISSN:0129-0835
Container-title:International Journal of PIXE
language:en
Short-container-title:Int. J. PIXE

Author:

MACARTHUR J. D.¹,MA XIN-PEI²

Affiliation:

1. Queen's University, Kingston, Canada, K7L 3N6, Canada

2. Institute of Atomic Energy, Beijing, P. R. China

Abstract

Particle-induced X-ray emission is very well suited for the analysis of geological samples. This review discusses the characteristics for such analyses. For light-element analysis, the complimentary technique of particle-induced gamma ray emission is also discussed since the emission of gamma rays occurs simultaneously with the X-rays. Not only are exploratory investigations of PIXE's capabilities presented but also synopses of studies aimed at answering geological questions. The latter have become more and more common in the last few years, an indication of PIXE's maturity as a technique for clement analysis of geological material.

Publisher

World Scientific Pub Co Pte Lt

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0129083591000226

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