Affiliation:
1. Department of Materials Science and Engineering, State University of New York, Stony Brook, NY 11794-2275, USA
Abstract
The tetragonal states of {001} films of cubic materials produced by coherent epitaxy on cubic {001} substrates are calculated for Cu and Fe assuming Poisson ratios for the bcc and fcc structures that are constant as the material deforms. The states lie on lines, referred to as epitaxial lines, on the plane, referred to as the tetragonal plane, whose axes are the aspect ratio c/a and volume per atom V. The results of quantitative low-energy electron diffraction (QLEED) for the bulk layer spacing of coherent epitaxial films of Cu and Fe, when plotted on the tetragonal plane, show whether the films lie on the bcc or fcc epitaxial line. Strain-energy calculations along the epitaxial lines lead to a critical value of a at which a first-order transition from one epitaxial line to the other occurs; this transition is illustrated by the epitaxial films of Fe, some of which lie on the bcc line and some on the fcc line.
Publisher
World Scientific Pub Co Pte Lt
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
35 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献