LOW ENERGY ION SCATTERING-Reference-Cited by-同舟云学术

LOW ENERGY ION SCATTERING

Published:2007-02 Issue:01 Volume:14 Page:31-41
ISSN:0218-625X
Container-title:Surface Review and Letters
language:en
Short-container-title:Surf. Rev. Lett.

Author:

SAMAVAT FERIDOUN¹,KING BRUCE V.²,O'CONNOR D. JOHN²

Affiliation:

1. Department of Physics, Bu-Ali Sina University, Hamedan, Iran

2. School of Mathematical and Physical Sciences, University of Newcastle, Callaghan, New South Wales, 2308, Australia

Abstract

Low energy ion scattering (LEIS) is the study of the composition and structure of a surface by the detection of low energy ions with energies ranging from 100 eV to 10 keV elastically scattered off the surface. The extreme sensitivity to the outermost atomic layer makes it as a unique tool for surface analysis. In this paper, concepts of shadowing, blocking, and also polar and azimuthal scans have been described. Surface order and surface atom spacings are revealed by using these concepts and measuring the intensity of backscattered projectiles as a function of the incident and azimuthal angles.

Publisher

World Scientific Pub Co Pte Lt

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0218625X07009001

Reference39 articles.

1. Surface Analysis Methods in Materials Science

2. Scattering of Low‐Energy Noble Gas Ions from Metal Surfaces

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