PHYSICAL PROPERTIES OF AU AND AL THIN FILMS MEASURED BY RESISTIVE HEATING
Author:
Affiliation:
1. Centro de Investigación y de Estudios Avanzados del IPN, Unidad Mérida, Departamento de Física Aplicada, A. P. 73 — Cordemex, 97310, Mérida, Yucatán, México
Abstract
Publisher
World Scientific Pub Co Pte Lt
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
https://www.worldscientific.com/doi/pdf/10.1142/S0218625X05006834
Reference13 articles.
1. Formation of the band gap energy on CdS thin films growth by two different techniques
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