IN SITU HALL MEASUREMENTS OF MACROSCOPIC ELECTRICAL PROPERTIES OF CHROMIUM-COVERED Si(111) SURFACES-Reference-Cited by-同舟云学术

IN SITU HALL MEASUREMENTS OF MACROSCOPIC ELECTRICAL PROPERTIES OF CHROMIUM-COVERED Si(111) SURFACES

Published:1999-02 Issue:01 Volume:06 Page:7-12
ISSN:0218-625X
Container-title:Surface Review and Letters
language:en
Short-container-title:Surf. Rev. Lett.

Author:

GALKIN N. G.¹²,GOROSHKO D. L.¹,KONCHENKO A. V.¹,IVANOV V. A.¹³,GOURALNIK A. S.¹

Affiliation:

1. Institute for Automation and Control Processes, Far Eastern Division of the Russian Academy of Sciences, 690041, Vladivostok, Russian Federation, Russia

2. Far Eastern State Technical University, 690069, Vladivostok, Russian Federation, Russia

3. Far Eastern State University, 690000, Vladivostok, Russian Federation, Russia

Abstract

The first in situ Hall measurements of the ordered chromium surface phases on Si(111) substrate and CrSi(111) epitaxial films after their formation are presented. Formation of Si (111)-(1× 1)- Cr (0.1 nm Cr) and Si(111)-[([Formula: see text])/30°]-Cr (0.3 nm Cr) surface phases results in an increase in the sheet resistivity of Si(111)-Cr surface phase samples. The conductivities along the surface phases at these chromium thicknesses are very low. The conductivity decrease is caused by a decrease in the electron mobility in the surface phase layers. Formation of an epitaxial CrSi(111) layer with averaged Hall parameters (hole mobility of 440 cm 2· V -1· s -1, sheet resistivity of 2.2·104 Ω-1 and sheet hole concentration of 0.65·1012 cm -2) has been observed at 1.5–1.8 nm of chromium thickness.

Publisher

World Scientific Pub Co Pte Lt

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0218625X99000032

Reference12 articles.

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4. Conductivity mechanisms in the ordered surface phases and two-dimensional monosilicides of Cr and Fe on Si(1 1 1);Applied Surface Science;2001-05

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