DETERMINATION OF THE OVERLAYER/SUBSTRATE REGISTRY IN Ni(1 ML)/Pt(111) BY ANGLE-SCANNED PHOTOELECTRON DIFFRACTION-Reference-Cited by-同舟云学术

DETERMINATION OF THE OVERLAYER/SUBSTRATE REGISTRY IN Ni(1 ML)/Pt(111) BY ANGLE-SCANNED PHOTOELECTRON DIFFRACTION

Published:1995-12 Issue:06 Volume:02 Page:787-793
ISSN:0218-625X
Container-title:Surface Review and Letters
language:en
Short-container-title:Surf. Rev. Lett.

Author:

SAMBI M.¹,PIN E.¹,GRANOZZI G.¹

Affiliation:

1. Dipartimento di Chimica Inorganica, Metallorganica ed Analitica, e Centro CSSRCC del, CNR, Università di Padova, via Loredan 4, 35131 Padova, Italy

Abstract

The site (fcc or hcp) occupied by the atoms of a Ni ML deposited on Pt (111) is determined in this paper using angle-scanned photoelectron diffraction (PD). A full 2π MgK α-excited Ni-2p 3/2 PD pattern from 1-ML Ni deposited on Pt(111) is compared to single scattering cluster-spherical wave (SSC-SW) simulations and the agreement between experimental and theoretical data is quantified by R-factor analysis. From the present investigation it turns out that Ni atoms occupy hcp sites. In addition, the Ni-Pt distance has been estimated to be 2.5±0.1 Å.

Publisher

World Scientific Pub Co Pte Lt

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0218625X95000716

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