INTRAGRANULAR LATTICE MISORIENTATION MAPPING BY SYNCHROTRON X-RAY MICRO-BEAMS: LAUE VS ENERGY-RESOLVED LAUE VS MONOCHROMATIC RECIPROCAL SPACE ANALYSIS-Reference-Cited by-同舟云学术

INTRAGRANULAR LATTICE MISORIENTATION MAPPING BY SYNCHROTRON X-RAY MICRO-BEAMS: LAUE VS ENERGY-RESOLVED LAUE VS MONOCHROMATIC RECIPROCAL SPACE ANALYSIS

Published:2010-01-20 Issue:01n02 Volume:24 Page:279-287
ISSN:0217-9792
Container-title:International Journal of Modern Physics B
language:en
Short-container-title:Int. J. Mod. Phys. B

Author:

HOFMANN FELIX¹,ABBEY BRIAN¹,SONG XU¹,DOLBNYA IGOR²,KORSUNSKY ALEXANDER M¹

Affiliation:

1. Department of Engineering Science, University of Oxford, Parks Road, Oxford, OX1 3PJ, Oxon, UK

2. Diamond Light Source, Didcot, OX11 0DE, UK

Abstract

Laue diffraction, energy scanning and reciprocal space mapping are three micro-beam synchrotron X-ray diffraction techniques allowing the investigation of local misorientation induced by the dislocation substructure. In this paper a comparison between the three methods is presented, based on the mapping of a single 311 reflection from a grain within a Ni polycrystal specimen deformed to a tensile plastic strain of ~9%. Qualitatively it is observed that the maps obtained by different techniques all share the same features, although some deviations exist due to experimental limitations associated with each of the measurement techniques.

Publisher

World Scientific Pub Co Pte Lt

Subject

Condensed Matter Physics,Statistical and Nonlinear Physics

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0217979210064216

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