ULTRATHIN SUPERCONDUCTING YBa2Cu3O7-δ FILMS OBTAINED BY HIGH OXYGEN PRESSURE DC SPUTTERING TECHNIQUE

Abstract

Ultrathin YBa 2 Cu 3 O 7-x films with thicknesses ranging from 24 Å to 300 Å have been grown by high oxygen pressure sputtering technique on (100)K SrTiO 3 substrates without any additional buffer layer. These samples have been characterized by means of X-Ray diffraction and transport measurements. The thickness was calibrated by using the low angle X-Ray diffraction thecnique. The superconducting properties indicated no degradation of the resistive T c (ρ=0)=89 K for the 300 Å samples, while T c (ρ=0)=35.3 K was measured on the 3 unit cell thick films.