Transmission and reflection characteristics of normal incidence on silicon-metal-silicon interface

Abstract

We investigate transmission and reflection properties of a broadband pulse with normal incidence on silicon-metal-silicon (SMS) for the first time, to the best of our knowledge. The results show that in lower frequency range, the transmission is close to zero, and the reflection and loss are in the range 0.50–0.90, 0.10 to 0.50, respectively. In higher frequency range, the transmission spectrum has two peaks, with transmittance 0.69, 0.90, and at same frequencies as the transmission peaks, the reflection spectrum has two troughs with reflectance 0.00, 0.02 and corresponding losses are 0.10, 0.29, respectively. This simple waveguide structure may have potential applications in silicon photonics, such as filters and laser oscillation cavities.