THEORETICAL ANALYSIS OF COEXISTING TETRAGONAL AND RHOMBOHEDRAL PHASE IN PB(ZR0.35TI0.65)O3 FILMS
Author:
Affiliation:
1. School of Science, Henan University of Science and Technology, Luoyang City, Henan Province 471003, China
2. National Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing, Jiangsu Province 210093, China
Abstract
Publisher
World Scientific Pub Co Pte Lt
Subject
Condensed Matter Physics,Statistical and Nonlinear Physics
Link
https://www.worldscientific.com/doi/pdf/10.1142/S0217979211058791
Reference11 articles.
1. Ferroelectric Memories
2. Demonstration of scaled (⩾0.12 μm2) Pb(Zr,Ti)O3 capacitors on W plugs with Al interconnect
3. Microelectromechanical systems (MEMS) accelerometers using lead zirconate titanate thick films
4. Effect of external mechanical stress on the domain structure of Pb(Zr0.35Ti0.65)O3 thin films
5. Thermodynamic analysis of stress effect on Bi4Ti3O12 films
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