Raman spectroscopy, X-ray diffraction and electrical properties of fullerene-based poly (methylmethacrylate) polymers

Abstract

Fullerene grafted poly (methylmethacrylate) polymers have been studied using X-ray diffraction and raman spectroscopy to analyze their polymeric structure. The electrical properties of prepared polymers have also been studied. The X-ray diffraction and raman spectroscopy pattern of pure buckminster fullerene ( C 60) has been compared with prepared polymeric samples. Raman spectroscopy indicates that a structural change occurs due to grafting. The vibrations in the relative intensity of peaks and shifts in energy are observed. The lower scattering efficiency of pure fullerene ( C 60) is observed at 1468 cm-1.The values for poly (methylmethacrylate) are observed at 3000 cm-1. The result show a large shift in the intense raman spectral region of fullerene-based poly (methylmethacrylate) which lies between 2500 cm-1 and 3000 cm-1. X-ray diffraction shows an unusual variation in crystallite size of polymeric samples. Generally it has been observed that polymers are insulators, but noticeably fullerene-based poly (methylmethacrylate) show conducting behavior.