Affiliation:
1. Department of Applied Mathematics, Donbass State Engineering Academy, 84313 Kramatorsk, Ukraine
Abstract
The relaxation rate of persistent current is studied theoretically in superconducting polycrystalline thin films. It is shown that varying the material parameters of grain anisotropy, grain size and film thickness does guide to a change of the current relaxation rate (CRR) mode. The point of degeneracy of CRR was obtained. The film-thickness dependent maxima are found in the behavior of CRR.
Publisher
World Scientific Pub Co Pte Lt
Subject
Condensed Matter Physics,Statistical and Nonlinear Physics