LINEWIDTH OF PHONONS IN ORDER–DISORDER PHASE TRANSITIONS WITH RANDOM TELEGRAPH NOISE

Abstract

We derive an expression for the linewidth of phonons involved in the order–disorder phase transitions in solids. The linewidth is obtained as a function of the dwell time from which the activation energy can be computed. A new viewpoint is presented on the assumption that the fluctuations in the random variable of the noise, which is carried by the random particles involved in the order–disorder mechanism, affect the linewidth of the phonons.