X-RAY PHOTO-EMISSION SPECTROSCOPIC STUDY ON Sm0.85Nd0.15Se-Reference-Cited by-同舟云学术

X-RAY PHOTO-EMISSION SPECTROSCOPIC STUDY ON Sm0.85Nd0.15Se

Published:2001-10-20 Issue:26 Volume:15 Page:3465-3470
ISSN:0217-9792
Container-title:International Journal of Modern Physics B
language:en
Short-container-title:Int. J. Mod. Phys. B

Author:

ARIPONNAMMAL S.¹,JAYAVEL R.²,NATARAJAN S.³

Affiliation:

1. Department of Physics, The Gandhigram Rural Institute, Deemed University, Gandhigram - 624 302 Dindigul District, Tamil Nadu, India

2. Department of Physics, Anna University, Madras - 600 025, India

3. Crystal Growth Centre Anna University, Madras - 600 025, India

Abstract

The X-ray photo-emission spectroscopy (XPS) measurements have been performed on Sm0.85Nd0.15Se . The results have shown that the Sm ion in the compound is existing in divalent state and there is no inter configuration mixing (ICF). Theoretically calculated valence also supports the conclusion drawn from XPS studies.

Publisher

World Scientific Pub Co Pte Lt

Subject

Condensed Matter Physics,Statistical and Nonlinear Physics

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0217979201007300

Reference11 articles.

1. High Pressure Electrical Resistivity Study of Sm0.85Nd0.15Se

2. Electrical conduction in rare-earth monoselenides and monotellurides and their alloys

3. Valence Mixing and Semiconductor-Metal Transition in the Sm Monochalcogenides

4. Nonmagnetic4fShell in the High-Pressure Phase of SmS

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Theoretical study of intermediate valence fluctuation in thulium selenide and electrical properties of TmSe1−xTex;Materials Today: Proceedings;2021-11